Design and fabrication of micro-cantilevers for multi-frequency atomic force microscopy
نویسندگان
چکیده
منابع مشابه
Sensitivity Analysis of Frequency Response of Atomic Force Microscopy in Liquid Environment on Cantilever's Geometrical Parameters
In this paper, the non-linear dynamic response of rectangular atomic force microscopy in tapping mode is considered. The effect of cantilever’s geometrical parameters (e.g., cantilever length, width, thickness, tip length and the angle between the cantilever and the sample's surface in liquid environment has been studied by taking into account the interaction forces. Results indicate that the r...
متن کاملHigh Resolution Image with Multi-wall Carbon Nanotube Atomic Force Microscopy Tip (RESEARCH NOTE)
In this paper, a simple and reproducible approach for attaching the multi-wall carbon nanotubes (MWNTs) to the apex of the atomic force microscope probe has been proposed. For this purpose, the dielectrophoresis method was applied due to its simple performance, cheapness and reliability. In this method, various parameters such as voltage, frequency, concentration of carbon nanotubes solution an...
متن کاملSensitivity of an Atomic Force Microscope Cantilever with a Crack
The atomic force microscope (AFM) has become an essential tool for the measurement of surface characteristics of diverse materials on a microand nanoscale level [1]. The resolution of measurements for the AFM cantilever is related to its vibration sensitivity. Many researchers have much interest in studying the resonant frequency and sensitivity analysis of AFM cantilevers [2 4]. Cracks may be ...
متن کاملStep-Height Measurement of Surface Functionalized Micromachined Microcantilever Using Scanning White Light Interferometry.
Micro-cantilever arrays with different dimensions are fabricated by micromachining technique onto silicon <1 0 0> substrate. These sputtered Gold-Coated micro-cantilevers were later surface functionalized. Scanning Electron Microscopy, Atomic Force Microscopy and Optical SWLI using LASER probe are employed to characterize the morphology and image measurement of the micro-cantilever arrays, resp...
متن کاملNon-contact atomic force microscopy characterization of micro-cantilevers and piezo electric transducers with frequencies up to the tens of MHz
We investigated the use of the non-contact atomic force microscopy (NCAFM) technique for evaluating high frequency mechanical vibrations. We demonstrated a clear resonance frequency (fres) of ∼11.8MHz measured from a 0.25 cm2 piece Si placed on top of a driven PZT and probed by an AFM cantilever.We also showed that the probe cantilever in the NCAFM was able to follow the envelope of a Si on PZT...
متن کامل